한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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- Pages.218-219
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- 2008
셀 구조에 따른 상변화 메모리의 전기 및 발열 해석
Electro and thermal Analysis of phase change memory with cell structure
- Choi, Hong-Kyw (Korea Maritime Univ.) ;
- Jang, Nak-Won (Korea Maritime Univ.) ;
- Kim, Hong-Seung (Korea Maritime Univ.) ;
- Lee, Seong-Hwan (Uiduk Univ.) ;
- Mah, Suk-Bum (Yong-In Songdam College)
- 발행 : 2008.06.19
초록
In this paper, we have investigated the phase change memory device with cell structure using three-dimensional finite element analysis tool for reducing reset current. From the simulation, the reset current of PRAM with