Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2008.06a
- /
- Pages.218-219
- /
- 2008
Electro and thermal Analysis of phase change memory with cell structure
셀 구조에 따른 상변화 메모리의 전기 및 발열 해석
- Choi, Hong-Kyw (Korea Maritime Univ.) ;
-
Jang, Nak-Won
(Korea Maritime Univ.)
;
-
Kim, Hong-Seung
(Korea Maritime Univ.)
;
-
Lee, Seong-Hwan
(Uiduk Univ.)
;
-
Mah, Suk-Bum
(Yong-In Songdam College)
- Published : 2008.06.19
Abstract
In this paper, we have investigated the phase change memory device with cell structure using three-dimensional finite element analysis tool for reducing reset current. From the simulation, the reset current of PRAM with