한국정보디스플레이학회:학술대회논문집
- 2008.10a
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- Pages.1555-1558
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- 2008
The Influence of Xe Content on Wall Voltage Transfer Behavior
- Baik, Bong-Joo (Digital Display Research Lab., LG Electronics) ;
- Choi, Kwang-Yeol (Digital Display Research Lab., LG Electronics) ;
- Min, Wong-Kee (Digital Display Research Lab., LG Electronics) ;
- Hong, Mun-Heon (LGE ARI) ;
- Lee, Dong-Woo (Digital Display Research Lab., LG Electronics) ;
- Min, Byung-Kuk (Digital Display Research Lab., LG Electronics) ;
- Kim, Weo-Dong (Digital Display Research Lab., LG Electronics)
- Published : 2008.10.13
Abstract
Various approaches were undertaken by major PDP makers in order to improve the luminous efficacy of the plasma discharge cells. There have been many reports that state that using a high Xe content PDP is one of the most promising key technologies available to improve the luminous efficacy. In the case of the higher Xe content panel, the higher address and sustain voltage were needed to drive the panel under the same reset condition. In this study, a variety of Xe content panels were investigated in order to examine wall voltage transfer behaviors. The transferred wall voltage status after addressing discharge at the same driving condition was analyzed by comparing Vt close curve of high and low Xe content panels. Through this analysis of Vt close curve difference, the driving waveform of a high Xe panel was quantitatively adjusted Under the same address voltage condition, results showed that the amount of the transferred wall voltage and Vt close curve after addressing discharge was matched for the first sustain discharge. Taking these results into consideration, we conclude that the driving waveform for different Xe content panels could be designed for the desired addressing discharge condition and the wall voltage state of the cell could be quantitatively controlled and measured through these approaches.