한국정보디스플레이학회:학술대회논문집

The Korean Infomation Display Society (한국정보디스플레이학회)
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Robustness of Display Hemispherical Reflectance Measurement Apparatus

  • Penczek, John (National Institute of Standards and Technology) ;
  • Kelley, Edward F. (National Institute of Standards and Technology) ;
  • Kim, Seung-Kwan (Korea Research Institute of Standards and Science)
  • Published : 2008.10.13
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Abstract

Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard integrating sphere method is compared to a sampling sphere apparatus.

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