한국정보디스플레이학회:학술대회논문집
- 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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- Pages.914-917
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- 2008
Quad-functional Built-in Test Circuit for DRAM-frame-memory Embedded SOG-LCD
- Takatori, Kenichi (Research Dept., NEC LCD Technologies, Ltd.) ;
- Haga, Hiroshi (Research Dept., NEC LCD Technologies, Ltd.) ;
- Nonaka, Yoshihiro (Research Dept., NEC LCD Technologies, Ltd.) ;
- Asada, Hideki (Research Dept., NEC LCD Technologies, Ltd.)
- 발행 : 2008.10.13
초록
A quad-functional built-in test circuit has been developed for DRAM-frame-memory embedded SOG-LCDs. The quad function consists of memory test, display test, serial transfer test, and parallel transfer test which is the normal operation mode for our SOG-LCD. Results of memory and display tests are shown.