한국정보디스플레이학회:학술대회논문집
- 2008.10a
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- Pages.572-575
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- 2008
Photoelectric Characteristics of a-Si:H Thin Film Transistor by Spectral Properties of Various Backlight Sources
- Choi, Kyung-Min (Dept. of Electronics Engineering, Kyungwon University) ;
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Kwon, Sang-Jik
(Dept. of Electronics Engineering, Kyungwon University)
;
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Cho, Eou-Sik
(Dept. of Electronics Engineering, Kyungwon University)
- Published : 2008.10.13
Abstract
Photo leakage characteristics of a-Si:H TFT were obtained for the illuminations from various backlight sources and the results were compared and analyzed in terms of the photoelectric properties of light. The analysis shows that the photocurrents are related to the wavelengths of the peak intensities of the spectrums of light sources.