Coherent X-ray Diffraction Imaging with Single-pulse Table-top Soft X-ray Laser

  • Kang, Hyon-Chol (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Kim, H.T. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Lee, S.K. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Kim, C.M. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Choi, I.W. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Yu, T.J. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Sung, J.H. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Hafz, N. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Jeong, T.M. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Kang, S.W. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Jin, Y.Y. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Noh, Y.C. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Ko, D.K. (Advanced Photonics Research Institute, Gwangju Institute of Science and Technology) ;
  • Kim, S.S. (Department of Materials Science and Technology, Gwangju Institute of Science and Technology) ;
  • Marathe, S. (Department of Materials Science and Technology, Gwangju Institute of Science and Technology) ;
  • Kim, S.N. (Department of Materials Science and Technology, Gwangju Institute of Science and Technology) ;
  • Kim, C. (Department of Materials Science and Technology, Gwangju Institute of Science and Technology) ;
  • Noh, D.Y. (Department of Materials Science and Technology, Gwangju Institute of Science and Technology) ;
  • Lee, J. (Advanced Photonics Research Institute)
  • Published : 2008.02.01

Abstract

We demonstrate coherent x-ray diffraction imaging using table-top x-ray laser at a wavelength of 13.9nm driven by 10-Hz ti:Sapphire laser system at the Advanced Photonics Research Institute in Korea. Since the flux of x-ray photons reaches as high as $10^9$ photons/pulse in a $20{\times}20{\mu}m^2$ field of view, we measured a ingle-pulse diffraction pattern of a micrometer-scale object with high dynamic range of diffraction intensities and successfully reconstructed to the image using phase retrieval algorithm with an oversampling ratio of 1:6. the imaging resolution is $^{\sim}150$ nm, while that is much improved by stacking the many diffraction patterns. This demonstration can be extended to the biological sample with the diffraction limited resolution.

Keywords