Comparative Analysis of properties of MWCNTs grown on Si substrate with different conductivity for using counter electrodes in DSSC

  • Kim, Geum-Chae (Department of Nano system engineering, center for Nano Manufacturing Inje University) ;
  • Lee, Sook-Young (Department of Nano system engineering, center for Nano Manufacturing Inje University) ;
  • Moon, Joon-Hee (Department of Nano system engineering, center for Nano Manufacturing Inje University) ;
  • Kim, Do-Hyun (Department of Nano system engineering, center for Nano Manufacturing Inje University) ;
  • Lee, Dong-Yoon (Optoelectric Research Group, Korea Electrotechnology Research Institute) ;
  • Jeon, Min-Hyon (Department of Nano system engineering, center for Nano Manufacturing Inje University)
  • Published : 2008.05.22