Proceedings of the Korean Institute of Surface Engineering Conference (한국표면공학회:학술대회논문집)
- 2007.04a
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- Pages.111-113
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- 2007
Thermal conductivity measurement of thin metallic films using radiation heat exchange method
Radiation heat exchange 방법을 이용한 금속박막의 열전도도 측정
- Published : 2007.04.05
Abstract
Thermal conductivities of copper thin films on silicon wafer was obtained from temperature distribution on the surface of wafer measured by radiation thermometry, when sample was heated with constant temperature ate the both ends in a vacuum and dissipate heat by radiation heat transfer into an environment.
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