Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지

A Study on Holographic Grating Formation in Se-base Amorphous Chalcogenide Thin Films

Se-base로 한 비정질 칼코게나이드 박막의 훌로그래픽 격자 형성

  • Ju, Long-Yun (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Choi, Hyuk (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Nam, Ki-Hyeon (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
  • Chung, Hong-Bay (Dept. of Electronic Materials Eng. Kwangwoon Univ.)
  • 구용운 (광운대학교 전자재료공학과) ;
  • 최혁 (광운대학교 전자재료공학과) ;
  • 남기현 (광운대학교 전자재료공학과) ;
  • 정홍배 (광운대학교 전자재료공학과)
  • Published : 2007.06.21
Download PDF
⟨ Previous Next ⟩

Abstract

In this paper, we investigated the diffraction grating efficiency on $Ge_{75}Se_{25}$ and Ag-doped amorphous chalcogenide $Ag/Ge_{75}Se_{25}$ thin film for used to volume hologram. The film thickness was 2 um and diffraction efficiency was obtained from He-Ne (632.8nm) and DPSS(532nm) (P:P) polarized laser beam on $Ge_{75}Se_{25}$ and Ag/$Ge_{75}Se_{25}$ thin films. As a result. for the films, the diffraction efficiency on Ag/$Ge_{75}Se_{25}$ double layer, was better than single $Ge_{75}Se_{25}$ thin films. The recording speed of DPSS laser is higher than that of He-Ne laser.

Keywords