TFT-LCD Defect Detection Using Self Quotient Image

Self Quotient Image를 이용한 TFT-LCD결함검출

  • Park, Woon-Ik (School of Electrical Engineering and Computer Science Kyungbook national university) ;
  • Lee, Kyu-Bong (School of Electrical Engineering and Computer Science Kyungbook national university) ;
  • Kim, Se-Yun (School of Electrical Engineering and Computer Science Kyungbook national university) ;
  • Park, Kil-Houm (School of Electrical Engineering and Computer Science Kyungbook national university)
  • 박운익 (경북대학교 대학원 전자전기컴퓨터공학과) ;
  • 이규봉 (경북대학교 대학원 전자전기컴퓨터공학과) ;
  • 김세윤 (경북대학교 대학원 전자전기컴퓨터공학과) ;
  • 박길흠 (경북대학교 대학원 전자전기컴퓨터공학과)
  • Published : 2007.06.25