The effect of the MgO process on the properties of AC-PDPs

  • Kim, Young-Sung (PDP Materials Gr., Digital Display Research Lab., LG Electronics Inc.) ;
  • Park, Min-Soo (PDP Materials Gr., Digital Display Research Lab., LG Electronics Inc.) ;
  • Ryu, Byung-Gil (PDP Materials Gr., Digital Display Research Lab., LG Electronics Inc.)
  • 발행 : 2007.08.27

초록

The effects of the MgO fabrication process on the properties of AC-PDPs were examined. MgO films were deposited by e-beam evaporation with various substrate temperatures and oxygen flow rates. MgO films were analyzed by XRD, CL and ellipsometer. Panel properties such as luminance, efficiency, discharge voltage and discharge delay time were measured with test panels. MgO films with higher temperature, smaller oxygen flow rate showed shorter discharge delay time. Also they showed smaller XRD peak intensity. These results revealed that the discharge delay time was strongly influenced by temperature and oxygen flow rate of the MgO fabrication process.

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