Thickness Dependence of Mean Free Path of Electron in Ta/NiFe/IrMn/Ta Multilayer

  • Kim, C.G. (Department of Materials Science and Engineering, Chungnam National University) ;
  • Thanh, N.T. (Department of Materials Science and Engineering, Chungnam National University) ;
  • Kim, C.O. (Department of Materials Science and Engineering, Chungnam National University)
  • 발행 : 2007.05.28