Annealing Temperature Dependence of Microwave Permeability in CoFe/Mnlr Bilayers

  • Kim, Dong-Young (ReCAMM, Chungnam National University) ;
  • Kim, C.O. (ReCAMM, Chungnam National University) ;
  • Tsunoda, M. (Department of Electronic Engineering, Tohoku University) ;
  • Takahashi, M. (Department of Electronic Engineering, Tohoku University)
  • 발행 : 2007.05.28