Exchange Bias Enhancement by Ultra-thin Mn Insertion at the Interface of Mn-Ir/Co-Fe Bilayers

  • Tsunoda, M. (Department of Electronic Engineering, Tohoku University) ;
  • Yoshitaki, S. (Department of Electronic Engineering, Tohoku University) ;
  • Ashizawa, Y. (New Industry Creation Hatchery Center, Tohoku University) ;
  • Kim, D.Y. (New Industry Creation Hatchery Center, Tohoku University) ;
  • Mitsumata, C. (New Industry Creation Hatchery Center, Tohoku University) ;
  • Takahashi, M. (Department of Electronic Engineering, Tohoku University)
  • Published : 2007.05.28