Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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Image Separation Average Value Matching Method Development for Accuracy Improvement of Appearance Inspection

외관 검사의 정확도 향상을 위한 영상 분할 평균값 매칭 기법 개발

  • Park, Se-Hyuk (Dept. of Electronic Computer Eng Dankook University) ;
  • Kang, Su-Min (Dept. of Electronic Computer Eng Dankook University) ;
  • Huh, Kyung-Moo (Dept. of Electronic Eng Dankook University)
  • 박세혁 (단국대학교 전자컴퓨터공학과) ;
  • 강수민 (단국대학교 전자컴퓨터공학과) ;
  • 허경무 (단국대학교 전자공학과)
  • Published : 2007.10.26
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Abstract

The goal of this paper is accuracy improvement of appearance inspection by using image separation average value matching method. The appearance inspection of various electronic products and parts has been executed by the eyesight of human. But inspection by eyesight can't bring about uniform inspection result. Because the appearance inspection result by eyesight of human is changed by condition of physical and spirit of the checker. So machine vision inspection system is currently used to many appearance inspection fields instead of the checker. However the inspection result of machine vision is changed by the illumination of workplace. Therefore we have used a average value matching in this paper for improvement of vision inspection accuracy and could increase inspection accuracy of vision system. In other words, we made an effort for elevation of vision inspection accuracy by making the identical image separation average value of reference image and input image. Also this system has been developed only using PC, CCD Camera and Visual C++ for universal workplace.

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