Relation between the Critical Current and the n-value of ReBCO Thin Films: A Scaling Law for Flux Pinning of ReBCO Thin Films
- Oh, Sang-Jun (National Fusion Research Center) ;
- Choi, Hee-Kyung (National Fusion Research Center) ;
- Lee, Chul-Hee (National Fusion Research Center) ;
- Lee, Sang-Moo (Korea Advanced Institute of Science and Technology) ;
- Yoo, Ja-Eun (Korea Advanced Institute of Science and Technology) ;
-
Youm, Do-Jun
(Korea Advanced Institute of Science and Technology)
;
- Yamada, H. (Maizuru National College of Technology) ;
- Yamasaki, H. (National Institute of Advanced Industrial Science and Technology)
- Published : 2007.07.01
Abstract
Keywords
- ReBCO thin film;
- coated conductor;
- angular dependence;
- the n-value;
- the Kramer model;
- the Tinkham model