한국우주과학회:학술대회논문집(한국우주과학회보) (Bulletin of the Korean Space Science Society)
- 한국우주과학회 2006년도 한국우주과학회보 제15권2호
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- Pages.65-65
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- 2006
Development of Standard Space Radiation Effects Test Methods - TID Effects of power MOSFETs
- Ryu, Kwang-Sun (Satellite Technology Research Center, KAIST) ;
- Shin, Gu-Whan (Satellite Technology Research Center, KAIST) ;
- Kim, Sung-Joon (Department of Physics, KAIST) ;
- Ko, Dai-Ho (Department of Physics, KAIST) ;
- Chung, Sung-In (Satellite Technology Research Center, KAIST) ;
- Min, Kyung-Wook (Department of Physics, KAIST) ;
- Lee, Sang-Hyun (Satellite Technology Research Center, KAIST) ;
- Kim, Hyung-Myung (Satellite Technology Research Center, KAIST)
- 발행 : 2006.10.26