한국통신학회:학술대회논문집 (Proceedings of the Korean Institute of Communication Sciences Conference)

한국통신학회 (The Korean Institute of Commucations and Information Sciences)

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Universal Vector Driven Tester (VDT) : New Test Solutions for Telecommunication Network System

이승렬 (삼성전자) ;
천병환 (삼성전자) ;
김용섭 (삼성전자) ;
김석호 (삼성전자)

Lee Seung-Y. (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.) ;
Chun Byung-Hwan (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.) ;
Kim Brian Y. (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.) ;
Kim Austin S. (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.)

발행 : 2006.07.01

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