Proceedings of the Korean Institute of Communication Sciences Conference (한국통신학회:학술대회논문집)

2006.07a
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Pages.420-420
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2006

The Korean Institute of Commucations and Information Sciences (한국통신학회)

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Universal Vector Driven Tester (VDT) : New Test Solutions for Telecommunication Network System

Lee Seung-Y. (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.) ;
Chun Byung-Hwan (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.) ;
Kim Brian Y. (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.) ;
Kim Austin S. (HIDS Lab. Telecommunication R&D Center, Samsung Electronics Co., Ltd.)

이승렬 (삼성전자) ;
천병환 (삼성전자) ;
김용섭 (삼성전자) ;
김석호 (삼성전자)

Published : 2006.07.01

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