Improvement of Anti-Collision Performance for the ISO 18000-6 Type C RFID system

ISO 18000-6 Type C RFID 시스템에서의 충돌방지 알고리즘 성능 개선

  • Lee Yeong-Jun (Department of Electronics Engineering, Pusan National University) ;
  • Kwon Dae-Ken (Department of Electronics Engineering, Pusan National University) ;
  • Kim Hyoung-Nam (Department of Electronics Engineering, Pusan National University)
  • 이영준 (부산대학교 전자공학과) ;
  • 권대근 (부산대학교 전자공학과) ;
  • 김형남 (부산대학교 전자공학과)
  • Published : 2006.07.01