Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2006.06a
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- Pages.257-258
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- 2006
Bending strain dependence of the critical current degradation behavior in externally-reinforced Bi-2223 tapes with different hermeticity under pressurized liquid nitrogen
외부 보강된 Bi-2223테이프의 가압 $LN_2$ 하에서 임계전류 열화거동의 굽힘변형률 의존성
- Shin, Hyung-Seop (Andong National University) ;
- Dizon, John Rvan C (Andong National University) ;
- Cho, Jeon-Wook (Korea Electrotechnology Research Institute) ;
- Ha, Dong-Woo (Korea Electrotechnology Research Institute) ;
- Oh, Sang-Soo (Korea Electrotechnology Research Institute)
- Published : 2006.06.22
Abstract
The
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