한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
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- Pages.43-44
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- 2006
PVA모드에서 공통 전극 패턴을 통한 전기장 간섭의 감소 효과
Reducing of cross-talk by patterning of common electrode in the patterned vertical alignment (PVA) mode
- Jeon, Yeon-Mun (Chonbuk National University) ;
- Kim, Youn-Sik (Chonbuk National University) ;
- Hwang, Seong-Jin (Chonbuk National University) ;
- Lee, Seung-Hee (Chonbuk National University) ;
- Lyu, Jae-Jin (Samsung Electronics LCD) ;
- Kim, Kyeong-Hyeon (Samsung Electronics LCD)
- 발행 : 2010.04.01
초록
We have studied electro-optical characteristics and stability of liquid crystal director depending on electrode patterning of common electrode on top substrate in patterned vertical alignment (PVA) mode. In the present studies, new type of common electrode pattern was suggested to enhance a dark state by reducing interference area due to data signal. According to the simulation result, PVA device with new common electrode pattern contributed to Improvement of an aperture ratio.