한국정보디스플레이학회:학술대회논문집
- 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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- Pages.1447-1450
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- 2006
Novel high speed and sensitivity array test system for LTPS LCD and OLED
- Chikamatsu, Kiyoshi (Agilent Technologies International Japan, Ltd.) ;
- Miyake, Yasuhiro (Agilent Technologies International Japan, Ltd.) ;
- Tajima, Kayoko (Agilent Technologies International Japan, Ltd.) ;
- Goto, Masaharu (Agilent Technologies International Japan, Ltd.) ;
- Mizoguchi, Junichi (Agilent Technologies International Japan, Ltd.)
- 발행 : 2006.08.22
초록
The high speed and sensitivity array test system has been developed and utilized for massproduction of advanced LTPS displays including SOG and OLED. It realizes fast enough TACT enabling 100% inspection with better than 1fF sensitivity. The result of actual measurement shows its superior TACT and sensitivity, and also shows MURA detection of OLED panel.
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