Synthesis of Chiral Poly(norbornene carboxylic acid ester)s and Their Characteristic Properties in The Thin Film

  • Byun, Gwang-Su (Department of Chemistry, National Research Lab for Polymer Synthesis & Physics, Pohang Accelerator Laboratory, Center for Integrated Molecular Systems, Polymer Research Institute, and BK School of Molecular Science, Pohang University of Science and Technology (POSTECH)) ;
  • Lee, Taek-Joon (Department of Chemistry, National Research Lab for Polymer Synthesis & Physics, Pohang Accelerator Laboratory, Center for Integrated Molecular Systems, Polymer Research Institute, and BK School of Molecular Science, Pohang University of Science and Technology (POSTECH)) ;
  • Jin, Kyeong-Sik (Department of Chemistry, National Research Lab for Polymer Synthesis & Physics, Pohang Accelerator Laboratory, Center for Integrated Molecular Systems, Polymer Research Institute, and BK School of Molecular Science, Pohang University of Science and Technology (POSTECH)) ;
  • Ree, Moon-Hor (Department of Chemistry, National Research Lab for Polymer Synthesis & Physics, Pohang Accelerator Laboratory, Center for Integrated Molecular Systems, Polymer Research Institute, and BK School of Molecular Science, Pohang University of Science and Technology (POSTECH)) ;
  • Kim, Sang-Youl (Polyolefin Materials Research Center, Department of Chemistry and School of Molecular Science (BK21), Korea Advanced Institute of Science and Technology (KAIST)) ;
  • Cho, I-Whan (Polyolefin Materials Research Center, Department of Chemistry and School of Molecular Science (BK21), Korea Advanced Institute of Science and Technology (KAIST))
  • Published : 2006.10.13

Abstract

We synthesized two novel polynorbornene derivatives, chiral poly(norbornene acid methyl ester) (C-PNME) and racemic poly(norbornene acid n-butyl ester) (R-PNME), which are potential low dielectric constant materials for applications in advanced microelectronic and display devices. Thin films of these polymers deposited on substrates were investigated by structural analyses using synchrotron grazing incidence X-ray scattering, specular reflectivity and ellipsometry. These analyses provided important information on the structure, electron density gradient across film thickness, chain orientation, refractive index and thermal expansion of the polymers in substrate-supported thin films. The structural characteristics and properties of the thin films were first dependent on the polymer chain' tacticity and further influenced by film thickness and thermal annealing.

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