Proceedings of the Polymer Society of Korea Conference (한국고분자학회:학술대회논문집)

The Polymer Society of Korea (한국고분자학회)
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Synchrotron Grazing Incidence X-ray Scattering and Its Applications in Polymer Nanotechnology

  • Ree, Moon-Hor (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Lee, Byeong-Du (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Yoon, Jin-Hwan (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Heo, Kyu-Young (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Jin, Kyeong-Sik (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Jin, Sang-Woo (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Kim, Hyun-Chul (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Kim, Gha-Hee (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Choi, Seung-Chul (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Oh, Weon-Tae (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Park, Young-Hee (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Hwang, Yong-Taek (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology) ;
  • Kim, Jong-Seong (Department of Chemistry, Pohang Accelerator Laboratory, National Research Laboratory of Polymer Synthesis and Physics, Division of Chemistry, BK21 Program, and Polymer Research Institute, Pohang University of Science and Technology)
  • Published : 2006.10.13
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Abstract

In our study grazing incidence X-ray scattering (GIXS) measurements with synchrotron radiation sources were conducted statically and in-situ for a series of nanoscale thin films prepared from nanoporous dielectrics, block copolymers, brush polymers, and molecular assemblies. All GIXS measurements were performed at the Pohang Accelerator Laboratory. The measured scattering data were analyzed in detail by using newly developed GIXS scattering theory. All GIXS results will be discussed in details with considering the materials chemistry and nanostructure formation process parameters.

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