Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2005.08a
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- Pages.42-43
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- 2005
Composition Depth Profiling of Fe/Ni and Pt/Co Multilayers Using a Buckminsterfullerene ($C_{60}$ ) Ion
- Kim, K.J. (Nano Surface Group, Korea Research Institute of Standards and Science) ;
- Moon, D.W. (Nano Surface Group, Korea Research Institute of Standards and Science) ;
- Chi, P. (Surface and Microanalysis Science Division, National Institute of Standards and Technology) ;
- Simons, D. (Surface and Microanalysis Science Division, National Institute of Standards and Technology) ;
- Gillen, G. (Surface and Microanalysis Science Division, National Institute of Standards and Technology)
- Published : 2005.08.18
Abstract
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