In situ x-ray scattering studies on the structural evolution of Ni/Au films on p-type GaN during thermal oxidation in air

  • Lee, Sung-Pyo (Department of Materials Science & Engineering, GIST) ;
  • Jang, Hyeon-Woo (Department of Materials Science & Engineering, GIST) ;
  • Noh, Do-Young (Department of Materials Science & Engineering, GIST)
  • 발행 : 2005.02.15