Non-invasive Measurements of the Thickness of Thin Superconductor Films and Metallic Films by Using the Dielectric Resonator Method
- Han, Hyun-Kyung (department of Advanced Technology Fusion and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
- Lee, J.H. (Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
- Park, E.K. (Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
- Jung, H.S. (Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
- Lee, C.S. ;
- Lee, Sang-Young (department of Advanced Technology Fusion and Center for Emerging Wireless Transmission Technology, Konkuk University, Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
- Lee, Byung-Joo (School of Materials Science and Engineering, Seoul National University) ;
- Park, Byung-Woo (School of Materials Science and Engineering, Seoul National University)
- Published : 2005.08.18
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