Hot Wall법에 의해 제작한 SrS:Ag 박막EL소자의 특성

Characterization of SrS:Ag Thin Film Electroluminescence Deposited by Hot Wall Technique

  • 이상태 (한국해양대학교 선박전자기계공학부) ;
  • 허성곤 (삼성중공업) ;
  • 이홍찬 (한국해양대학교 선박전자기계공학부)
  • 발행 : 2005.11.01

초록

The SrS:Ag, Cl thin films have been grown by the hot wall technique with S furnace placed on the outside of the growth chamber in order to investigate the crystallographic and optical characteristics. The XRD patterns indicate a strongly preferential orientation in the [200] direction. The PL spectrum has an emission peak of about 398nm which is assigned by the transition from $4d^{95}s^1$ to $4d^{10}$ of$Ag^+$ center.

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