Estimation of Qualities and Inference of Operating Conditions for Optimization of Wafer Fabrication Using Artificial Intelligent Methods

The purpose of this study was to develop a process management system to manage ingot fabrication and the quality of the ingot. The ingot is the first manufactured material of wafers. Operating data (trace parameters) were collected on-line but quality data (measurement parameters) were measured by sampling inspection. The quality parameters were applied to evaluate the quality. Thus, preprocessing was necessary to extract useful information from the quality data. First, statistical methods were employed for data generation, and then modeling was accomplished, using the generated data, to improve the performance of the models. The function of the models is to predict the quality corresponding to the control parameters. The dynamic polynomial neural network (DPNN) was used for data modeling that used the ingot fabrication data.