Hysteresis Compensating of PZT Actuator in Micro Tensile Tester Using Inverse Compensation Method

  • Lee, Hye-Jin (Micro Forming Technology Team, Korea Institute of Industrial Technology, Incheon Metropolitan City, Faculty of Aerospace and mechanical Engineering, Hankuk aviation University) ;
  • Kim, Seung-Soo (Micro Forming Technology Team, Korea Institute of Industrial Technology, Incheon Metropolitan City) ;
  • Lee, Nak-Kyu (Digital Production Processing Team, Korea Institute of Industrial Technology, Incheon Metropolitan City) ;
  • Lee, Hyoung-Wook (Digital Production Processing Team, Korea Institute of Industrial Technology, Incheon Metropolitan City) ;
  • Hwang, Jai-Hyuk (Faculty of Aerospace and mechanical Engineering, Hankuk aviation University) ;
  • Han, Chang-Soo (Faculty of Mechanical Engineering, Hanyang University)
  • Published : 2005.06.02

Abstract

Researches about micro technology travel lively in these days. Such many researches are concentrated in the field of materials and a process field. But properties of micro materials should be known to give results of research developed into still more. In these various material properties, mechanical property such as tensile strength, elastic modulus, etc is the basic property. To measure mechanical properties in micro or nano scale, actuating must be very precise. PZT is a famous actuator which becomes a lot of use to measure very precise mechanical properties in micro research field. But PZT has a nonlinearity which is called as hysteresis. Not precision result is caused because of this hysteresis property in PZT actuator. Therefore feedback control method is used in many researches to prevent this hysteresis of PZT actuator. Feedback control method produce a good result in processing view, but cause a loss in a resolution view. In this paper, hysteresis is compensated by open loop control method. Hysteresis property is modeled in Mathematical function and compensated control input is constructed using inverse function of original data. Reliability of this control method can be confirmed by testing nickel thin film that is used in MEMS material broadly.

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