Specification-based Current Test for Mixed-signal Circuits and Optimal Test Point Selection

혼합신호 회로를 위한 Specification 기반의 전류 테스트와 최적의 테스트 포인트 선택

Testing of mixed-signal circuit has become a difficult task for test engineers and efficient test solution to these problems are needed. In this paper a new specification-based mixed-signal test method called TSS(Time Slot Specification) using high performance current sensors and a novel test point selection technique without heavy computational overhead are proposed. External output and power nodes are used for test points and accessed by the current sensors in the ATE.