Stress Analysis of IPS Lower bracket

  • Lee, J.M. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Park, K.N. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Chi, D.Y. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Park, S.K. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Sim, B.S. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Lee, H.H. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Ahn, S.H. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Lee, C.Y. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute) ;
  • Kim, H.R. (HANARO Utilization Technology Division, 3-Pin Fuel Test Loop R&D Department, Korea Atomic Energy Research Institute)
  • Published : 2005.10.27