Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지

Analysis of noise rejection of stored holographic digital data on the chalcogenide thin film

칼코게나이드 박막에 저장된 홀로그래픽 디지털 정보의 잡음 제거에 관한 연구

  • Lim, Byoung-Rock (Department of Electronic Materials Engineering of Kwangwoon Univ.) ;
  • Lee, Woo-Sung (Department of Electronic Materials Engineering of Kwangwoon Univ.) ;
  • Ahn, Kwang-Seop (Department of Electronic Materials Engineering of Kwangwoon Univ.) ;
  • Yeo, Cheol-Ho (Department of Electronic Materials Engineering of Kwangwoon Univ.) ;
  • Chung, Hong-Bay (Department of Electronic Materials Engineering of Kwangwoon Univ.)
  • 임병록 (전자재료공학과 광운대학교) ;
  • 이우성 (전자재료공학과 광운대학교) ;
  • 안광섭 (전자재료공학과 광운대학교) ;
  • 여철호 (전자재료공학과 광운대학교) ;
  • 정홍배 (전자재료공학과 광운대학교)
  • Published : 2005.07.07
Download PDF
⟨ Previous Next ⟩

Abstract

The Analog data is impossible to perfect reconstruct original data at a hologram data storage because of noise such as cross talk. So it is necessary that data can be stored by digital signal unavoidably. Therefore this work deals with experiments from this point of view through writing & reading of digital data. We stored 256bit digital data at one point on As-Ge-Se-S chalcogenide thin film and we reconstruct original data of 100% through the specified algorithm such as the histogram equalization, the interactive correction, etc. This result shows that the data is able to reconstruct under relative low diffraction efficiency. As the result, we expect the possibility of chalcogenide thin film for HDDS as the analysis of the effective resolution refer to reconstruction rate and diffraction efficiency.

Keywords