Failure Mode Analysis for Polymer EL Blue Devices' Lifetime

We report failure mode observed in polymer EL blue devices, relating with life curve. The modes are analyzed by observing compositional and morphological variation using TEM-EDX, STM, and reverse engineering method as destructive ways, and also investigated mobility changes of hole and electron by measuring transient EL as a nondestructive way corresponding to life curve. We believe that the postulated failure modes in polymer EL devices can present right directions to obtain better performance, especially life time, of polymer devices in material and device structural designing points of view.