In-situ HVEM study of the phase change behaviors of the amorphous $Ge_2Sb_2Te_5$ thin films

• Lee, Sang-Yub (Institute of physics and applied physics, Yonsei University) ;
• Bea, Byung-Tack (Institute of physics and applied physics, Yonsei University) ;
• Lee, Kyu-Min (Institute of physics and applied physics, Yonsei University) ;
• Choi, Jin-Moon (Institute of physics and applied physics, Yonsei University) ;
• Jeong, Kwang-Ho (Institute of physics and applied physics, Yonsei University)

• Published : 2005.11.01

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