한국전자현미경학회:학술대회논문집

Korean Society of Microscopy (한국현미경학회)
권호 표지

Measurement of local strain and atomic distribution in InGaAs/GaAsP Multi-quantum well

  • Baik, Sung-Il (School of Materials Science and Engineering, Seoul National University) ;
  • Kim, Ki-Sung (Photonics Laboratory, Samsung Advanced Institute of Technology) ;
  • Park, Young-Jo (Photonics Laboratory, Samsung Advanced Institute of Technology) ;
  • Kim, Young-Woon (School of Materials Science and Engineering, Seoul National University)
  • Published : 2005.05.01
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