Abstract
The resilience of the exchange bias ($H_{EX}$) in ferromagnet / antiferromagnet bilayers is generally studied in terms of repeated hysteresis loop cycling or by protracted annealing under reversed field (training and long-term relaxation respectively). The stability of $H_{EX}$ is fundamental for practical application of exchange bias systems. In this paper we report measurements of training and relaxation in FeNi films coupled with the antiferromagnet FeMn. We show that $H_{EX}$ suppressed both by training and relaxation was partially recovered as soon as a field cycling for consecutive hysteresis loop measurement was stopped or the magnetization of the ferromagnet was switched back to the biased direction.