Proceedings of the Korean Society of Plant Pathology Conference (한국식물병리학회:학술대회논문집)
- 2005.04a
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- Pages.92.1-92.1
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- 2005
Atomic force microscopy where BT and NT meet: a platform technology for imaging and nanoscale morphometry of microbial cells
- Kim K.W. (National Instrumentation Center for Environmental Management, Seoul National University) ;
- Park E.W. (Department of Agricultural Biotechnology, Seoul National University)
- Published : 2005.04.01
Abstract
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