대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2005년도 제36회 하계학술대회 논문집 C
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- Pages.1945-1947
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- 2005
전해 캐패시터의 최적 가속시험방법과 수명예측
The best accelerated method and lifetime prediction of electrolytic capacitors
- 김하나 (명지대학교 전기전자재료연구실) ;
- 심찬호 (명지대학교 전기전자재료연구실) ;
- 김성준 (명지대학교 전기전자재료연구실) ;
-
윤중락
(삼화콘덴서(주))
;
-
이헌용
(명지대학교 전기전자재료연구실)
- Kim, Ha-Na (University of Myong Ji) ;
- Sim, Chan-Ho (University of Myong Ji) ;
- Kim, Sung-Jun (University of Myong Ji) ;
-
Yoon, Jung-Rag
(SamHwa Capacitor Inc.)
;
-
Lee, Hun-Yong
(University of Myong Ji)
- 발행 : 2005.07.18
초록
This study considers find out best accelerated life testing and lifetime prediction of electrolytic capacitors. We proved about relation between failure and deterioration mechanism from last thesis. Beside we performed test that temperature and voltage press higher than allowance specification. Failure distribution acquired from those test. And wiebull function and Minitab program applied to accelerated constant and lifetime by means of calculation. At the result, goodness of fit affect to weibull function and acceleration factor therefore fitting is important factor in reliability testing.
키워드