Structural and Electrical Properties of PZT Heterolayered Thick Films

PZT 이종층 후막의 구조적, 전기적 특성

PZT(40/60) and PZT(60/40) powders, prepared by the sol-gel method, were mixed with an organic vehicle and the PZT(40/60)/PZT(60/40) heterolayered thick films were fabricated by the screen-printing method on $Pt/Al_2O_3$ substrates. The structural properties such as DTA, X-ray diffraction and microstructure, were examined as a function of the applied pressure. In the DTA analysis, the formation of the polycrystalline perovskite phase was observed at around $880^{\circ}C$. The average thickness of the PZT heterolayered thick films which were coated five times was approximately $95-100{\mu}m$.