Proceedings of the Korean Reliability Society Conference (한국신뢰성학회:학술대회논문집)

The Korean Reliability Society (한국신뢰성학회)
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Bayesian Approach for Software Reliability Growth Model with Random Cost

  • Kim Hee Soo (School of Aerospace and Naval Architecture, Chosun University) ;
  • Shin Mi Young (Department of Mathematics, Catholic University of Korea) ;
  • Park Dong Ho (Department of Information and Statistics, Hallym University)
  • Published : 2005.06.01
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Abstract

In this paper, we generalize the software reliability growth model by assuming that the testing cost and maintenance cost are random and adopts the Bayesian approach to determine the optimal software release time. Numerical examples are provided to illustrate the Bayesian method for certain parametric models.

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