한국진공학회:학술대회논문집 (Proceedings of the Korean Vacuum Society Conference)
- 한국진공학회 2004년도 제27회 학술발표회 초록집
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- Pages.165-165
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- 2004
Correlation of MS interface states to the Schottky barrier height and manufacture of the Metal-Silicon Schottky junction diode
- Jun, Sung-Ho (Dept. of Nano Science and Technology, University of Seoul) ;
- Ham, Chul-Young (Dept. of Nano Science and Technology, University of Seoul) ;
- Han, Hee-Soo (Dept. of Nano Science and Technology, University of Seoul) ;
- Ko, Chang-Hun (Dept. of Physics, University of Seoul) ;
- Han, Moon-Sup (Dept. of Physics, University of Seoul) ;
- Park, Kyoung-Wan (Dept. of Nano Science and Technology, University of Seoul)
- 발행 : 2004.08.19