Effect of high-frequency variation on ArF PR deformation and silicon nitride etching by dual frequency superimposed (DFS) rf capacitive coupled plasma

  • Lee, N.E. (Dept. of Materials Science and Engineering and Center for Advanced Plasma Surface Technology Sungkyunkwan University) ;
  • Kim, D.H. (Dept. of Materials Science and Engineering and Center for Advanced Plasma Surface Technology Sungkyunkwan University)
  • 발행 : 2004.08.19