Effect of Film Thickness on Critical Current of the YBCO Films Deposited by Cold-wall Type MOCVD Method
- Kim, Ho-Jin (Department of Nuclear Materials Development, Korea Atomic Energy Research Institute, Department of Advanced Materials Engineering, Sungkyunkwan University) ;
-
Joo, Jin-Ho
(Department of Advanced Materials Engineering, Sungkyunkwan University)
;
- Choi, Jun-Kyu (Department of Nuclear Materials Development, Korea Atomic Energy Research Institute) ;
-
Jun, Byung-Hyuk
(Department of Nuclear Materials Development, Korea Atomic Energy Research Institute)
;
-
Kim, Chan-Joong
(Department of Nuclear Materials Development, Korea Atomic Energy Research Institute)
- Published : 2004.08.16