The classified method for overlapping data

In this paper we introduce a new prototype based classifiers for overlapping data, where training pattern can be overlap on the feature space. The proposed classifier is based on the prototype from neural network classifier (NNC)[1] for overlap data. The method automatically chooses the initial center and two radiuses for each class. The center is used as a mean representative of training data for each class. The unclassified pattern is classified by measure distance from the class center. If the distance is in the lower (shorter radius) the unknown pattern has the high percentage of being in this class. If the distance is between the lower and upper (further radius), the pattern has the probability of being in this class or others. But if the distance is outside the upper, the pattern is not in this class. We borrow the words upper and lower from the rough set to represent the region of certainty [3]. The training algorithm to find number of cluster and their parameters (center, lower, upper) is presented. The clustering result is tested using patterns from Thai handwritten letter and the clustering result is very similar to human eyes clustering.