Proceedings of the Korean Society for Quality Management Conference (한국품질경영학회:학술대회논문집)
- 2004.04a
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- Pages.148-151
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- 2004
A new Intelligent Yield Management Methodology based on Feature Manipulation
특성 변동 관리에 기반한 지능적 수율관리 방안
Abstract
This study presents a new intelligent yield management methodology which can forecast the yield level of a production unit based on features' behaviors. In this proposed methodology, we identify the existing features using C5.0 that are combination of nodes (i.e., variables) in the decision tree generated by C5.0, use SOM(Self-Organizing Map) neural networks in oder to extract the feature's patterns and classify, and then make features' control rules using C5.0.
Keywords