한국품질경영학회:학술대회논문집 (Proceedings of the Korean Society for Quality Management Conference)
- 한국품질경영학회 2004년도 품질경영모델을 통한 가치 창출
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- Pages.85-89
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- 2004
HALT와 고장분석을 이용한 STN LCD 모듈의 신뢰성 평가에 관한 연구
Anapproach of Combining HALT and Failureanalysis for STNLCD Reliability Assessment
- Kang Bo-Chul (Reliability & Failure Analysis Center, KETI) ;
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Hong Won-Sik
(Reliability & Failure Analysis Center, KETI) ;
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Cho Jai-Rip
(Dept. of Industrial Engineering, Kyung Hee University)
- 발행 : 2004.04.01
초록
This brief paper is an application of HALT(High Accelerated Life Test) and FA(Failure analysis) to improvement of STN LCD module. Before HALT the result of environmental test is good. So, we choose the technique of HALT to evaluate reliability. After HALT and Fa, we suggest some methods to improve reliability
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