한국정보디스플레이학회:학술대회논문집

The Korean Infomation Display Society (한국정보디스플레이학회)
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Accelerated Stress Testing of a-Si:H Pixel Circuits for AMOLED Displays

  • Sakariya, Kapil (Dept. of Electrical and Computer Engineering, University of Waterloo) ;
  • Sultana, Afrin (Dept. of Electrical and Computer Engineering, University of Waterloo) ;
  • Ng, Clement K.M. (Dept. of Electrical and Computer Engineering, University of Waterloo) ;
  • Nathan, Arokia (Dept. of Electrical and Computer Engineering, University of Waterloo)
  • Published : 2004.08.23
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Abstract

Unlike OLEDs, there is no lifetime testing procedure for TFTs. In this work, we have defined such a procedure and developed a method for the accelerated stress testing of TFT pixel circuits in a-Si AMOLED displays. The acceleration factors derived are based on high current and temperature stress, and can be used to significantly reduce the testing time required to guarantee a 20000-hour display backplane lifespan.

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